Journal of electronic testing theory and applications : (JETTA).
محفوظ في:
| مؤلف مشترك: | |
|---|---|
| التنسيق: | الكتروني دورية |
| اللغة: | English |
| منشور في: |
Boston, U.S.A. :
Kluwer Academic Publishers,
1990-
New York : Sp |
| الموضوعات: | |
| الوصول للمادة أونلاين: | Enlace del recurso |
| _version_ | 1849705457435803648 |
|---|---|
| author_corporate | IEEE Computer Society. Technical Council on Test Technology |
| author_corporate_role | |
| author_facet | IEEE Computer Society. Technical Council on Test Technology |
| building | Library A |
| callnumber-first | T - Technology |
| callnumber-label | TK7869 |
| callnumber-raw | TK7869 .J68 |
| callnumber-search | TK7869 .J68 |
| callnumber-sort | TK 47869 J68 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | Ebsco Academic Search Premier |
| ctrlnum | (EBZ)ebs797284e |
| dateSpan | Vol. 1, no. 1 (Feb. 1990)- |
| format | Electronic Journal |
| fullrecord | {"leader":"02148cas a22004692a 4500","fields":[{"001":"ebs797284e"},{"003":"EBZ"},{"006":"m d ||||||"},{"007":"cr|unu||||||||"},{"008":"900824c19909999nyubr p o 0 a0eng c"},{"022":{"subfields":[{"a":"1573-0727"},{"y":"0923-8174"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"a":"(EBZ)ebs797284e"}],"ind1":" ","ind2":" "}},{"040":{"subfields":[{"a":"NDD "},{"b":"eng "},{"d":"EBZ"}],"ind1":" ","ind2":" "}},{"042":{"subfields":[{"a":"pcc nsdp"}],"ind1":" ","ind2":" "}},{"050":{"subfields":[{"a":"TK7869"},{"b":".J68"}],"ind1":"0","ind2":"0"}},{"130":{"subfields":[{"a":"Journal of electronic testing (Online)"}],"ind1":"0","ind2":" "}},{"222":{"subfields":[{"a":"Journal of electronic testing"}],"ind1":"1","ind2":"0"}},{"245":{"subfields":[{"a":"Journal of electronic testing"},{"h":"[electronic resource] :"},{"b":"theory and applications : (JETTA)."}],"ind1":"0","ind2":"0"}},{"246":{"subfields":[{"a":"Theory and applications : (JETTA)"}],"ind1":"3","ind2":"0"}},{"246":{"subfields":[{"a":"JETTA"}],"ind1":"3","ind2":"0"}},{"260":{"subfields":[{"3":"1990- :"},{"a":"Boston, U.S.A. :"},{"b":"Kluwer Academic Publishers,"},{"c":"1990-"}],"ind1":" ","ind2":" "}},{"260":{"subfields":[{"3":"<2010-> :"},{"a":"New York :"},{"b":"Sp"}],"ind1":"3","ind2":" "}},{"310":{"subfields":[{"a":"Bimonthly,"},{"b":"<Apr. 1995->"}],"ind1":" ","ind2":" "}},{"362":{"subfields":[{"a":"Vol. 1, no. 1 (Feb. 1990)-"}],"ind1":"0","ind2":" "}},{"550":{"subfields":[{"a":"A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010->"}],"ind1":" ","ind2":" "}},{"650":{"subfields":[{"a":"Electronic apparatus and appliances"},{"x":"Testing"},{"v":"Periodicals."}],"ind1":" ","ind2":"0"}},{"650":{"subfields":[{"a":"Electronic apparatus and appliances"},{"x":"Testing."},{"2":"fast"},{"0":"(OCoLC)fst00906837"}],"ind1":" ","ind2":"7"}},{"650":{"subfields":[{"a":"Elektrische Messtechnik."},{"2":"swd"}],"ind1":"0","ind2":"7"}},{"650":{"subfields":[{"a":"Elektronik."},{"2":"swd"}],"ind1":"0","ind2":"7"}},{"650":{"subfields":[{"a":"Elektronisches Bauelement."},{"2":"swd"}],"ind1":"0","ind2":"7"}},{"650":{"subfields":[{"a":"Pru\u0308ftechnik."},{"2":"swd"}],"ind1":"0","ind2":"7"}},{"650":{"subfields":[{"a":"Test."},{"2":"swd"}],"ind1":"0","ind2":"7"}},{"650":{"subfields":[{"a":"Testen."},{"2":"swd"}],"ind1":"0","ind2":"7"}},{"650":{"subfields":[{"a":"Zeitschrift."},{"2":"swd"}],"ind1":"0","ind2":"7"}},{"655":{"subfields":[{"a":"Periodicals."},{"2":"fast"},{"0":"(OCoLC)fst01411641"}],"ind1":" ","ind2":"7"}},{"655":{"subfields":[{"a":"Periodicals."},{"2":"lcgft"},{"0":"http://id.loc.gov/authorities/genreForms/gf2014026139"},{"0":"(uri) http://id.loc.gov/authorities/genreForms/gf2014026139"}],"ind1":" ","ind2":"7"}},{"710":{"subfields":[{"a":"IEEE Computer Society."},{"b":"Technical Council on Test Technology."}],"ind1":"2","ind2":" "}},{"773":{"subfields":[{"t":"Academic Search Premier "},{"d":"EBSCO"}],"ind1":"0","ind2":" "}},{"776":{"subfields":[{"i":"Online version:"},{"t":"Journal of electronic testing (Online)"},{"x":"1573-0727"},{"w":"(DLC) 2004229188"},{"w":"(OCoLC)38266720"}],"ind1":"0","ind2":"8"}},{"776":{"subfields":[{"t":"Journal of electronic testing"},{"x":"0923-8174"},{"w":"(OCoLC)22270507"},{"w":"(DLC)95657656"}],"ind1":"1","ind2":" "}},{"856":{"subfields":[{"3":"Abstracts available: Feb 2007-."},{"u":"https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=aph&jid=OHT&scope=site"},{"z":"Enlace del recurso"}],"ind1":"4","ind2":"0"}},{"901":{"subfields":[{"a":"Academic Journal"}],"ind1":" ","ind2":" "}}]}
|
| genre | Periodicals. fast (OCoLC)fst01411641 Periodicals. lcgft http://id.loc.gov/authorities/genreForms/gf2014026139 (uri) http://id.loc.gov/authorities/genreForms/gf2014026139 |
| genre_facet | Periodicals. |
| id | ebs797284e |
| illustrated | Illustrated |
| institution | EBSCO |
| issn | 1573-0727 0923-8174 |
| language | English |
| marc_error | Info : MARC8 translation shorter than ISO-8859-1, choosing MARC8. --- [ 901 : a ] |
| publishDate | 1990 |
| publisher | Kluwer Academic Publishers, Sp |
| record_format | marc |
| spelling | Journal of electronic testing (Online) Journal of electronic testing Journal of electronic testing [electronic resource] : theory and applications : (JETTA). Theory and applications : (JETTA) JETTA 1990- : Boston, U.S.A. : Kluwer Academic Publishers, 1990- <2010-> : New York : Sp Bimonthly, <Apr. 1995-> Vol. 1, no. 1 (Feb. 1990)- A journal serving electronic test professionals in concurrence with the Test Technology technical council (TTTC) of the IEEE Computer Society, <2010-> Electronic apparatus and appliances Testing Periodicals. Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Elektrische Messtechnik. swd Elektronik. swd Elektronisches Bauelement. swd Prüftechnik. swd Test. swd Testen. swd Zeitschrift. swd Periodicals. fast (OCoLC)fst01411641 Periodicals. lcgft http://id.loc.gov/authorities/genreForms/gf2014026139 (uri) http://id.loc.gov/authorities/genreForms/gf2014026139 IEEE Computer Society. Technical Council on Test Technology. Academic Search Premier EBSCO Online version: Journal of electronic testing (Online) 1573-0727 (DLC) 2004229188 (OCoLC)38266720 Journal of electronic testing 0923-8174 (OCoLC)22270507 (DLC)95657656 Abstracts available: Feb 2007-. https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=aph&jid=OHT&scope=site Enlace del recurso |
| spellingShingle | Journal of electronic testing theory and applications : (JETTA). Electronic apparatus and appliances Testing Periodicals. Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Elektrische Messtechnik. swd Elektronik. swd Elektronisches Bauelement. swd Prüftechnik. swd Test. swd Testen. swd Zeitschrift. swd |
| thumbnail | /EBSCO/ebsco_academic_search_premier/logo.png |
| title | Journal of electronic testing theory and applications : (JETTA). |
| title_alt | Journal of electronic testing (Online) Theory and applications : (JETTA) JETTA |
| title_auth | Journal of electronic testing theory and applications : (JETTA). |
| title_full | Journal of electronic testing [electronic resource] : theory and applications : (JETTA). |
| title_fullStr | Journal of electronic testing [electronic resource] : theory and applications : (JETTA). |
| title_full_unstemmed | Journal of electronic testing [electronic resource] : theory and applications : (JETTA). |
| title_short | Journal of electronic testing |
| title_sort | journal of electronic testing theory and applications jetta |
| title_sub | theory and applications : (JETTA). |
| topic | Electronic apparatus and appliances Testing Periodicals. Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Elektrische Messtechnik. swd Elektronik. swd Elektronisches Bauelement. swd Prüftechnik. swd Test. swd Testen. swd Zeitschrift. swd |
| topic_facet | Electronic apparatus and appliances Elektrische Messtechnik. Elektronik. Elektronisches Bauelement. Prüftechnik. Test. Testen. Zeitschrift. Testing Testing. |
| url | https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=aph&jid=OHT&scope=site |
| work_keys_str_mv | UT journalofelectronictestingonline AT ieeecomputersocietytechnicalcouncilontesttechnology journalofelectronictestingtheoryandapplicationsjetta AT ieeecomputersocietytechnicalcouncilontesttechnology theoryandapplicationsjetta AT ieeecomputersocietytechnicalcouncilontesttechnology jetta |
