IEEE transactions on reliability
Salvato in:
| Titolo precedente: | IRE transactions on reliability and quality control |
|---|---|
| Enti autori: | , , , |
| Natura: | Elettronico Periodico |
| Lingua: | English |
| Pubblicazione: |
[New York, N.Y.] :
[Institute of Electrical and Electronics Engineers],
[©1963]-
|
| Soggetti: | |
| Accesso online: | Enlace del recurso |
| _version_ | 1849706551889100803 |
|---|---|
| author_corporate | Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability IEEE Reliability Group IEEE Reliability Society American Society for Quality Control. Electronics Division |
| author_corporate_role | |
| author_facet | Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability IEEE Reliability Group IEEE Reliability Society American Society for Quality Control. Electronics Division |
| building | Library A |
| callnumber-first | T - Technology |
| callnumber-label | TK7800 |
| callnumber-raw | TK7800 .I16 |
| callnumber-search | TK7800 .I16 |
| callnumber-sort | TK 47800 I16 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | Ebsco Engineering Source |
| ctrlnum | (EBZ)ebs737984e |
| dateSpan | Vol. R-12, no. 1 (Mar. 1963)- |
| format | Electronic Journal |
| fullrecord | {"leader":"02656cas a22005172a 4500","fields":[{"001":"ebs737984e"},{"003":"EBZ"},{"006":"m d ||||||"},{"007":"cr|unu||||||||"},{"008":"751101c19639999nyuqr p o 0 a0eng c"},{"022":{"subfields":[{"a":"1558-1721"},{"y":"0018-9529"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"a":"(EBZ)ebs737984e"}],"ind1":" ","ind2":" "}},{"040":{"subfields":[{"a":"MUL "},{"b":"eng "},{"d":"EBZ"}],"ind1":" ","ind2":" "}},{"042":{"subfields":[{"a":"nsdp pcc"}],"ind1":" ","ind2":" "}},{"050":{"subfields":[{"a":"TK7800"},{"b":".I16"}],"ind1":"0","ind2":"0"}},{"130":{"subfields":[{"a":"IEEE transactions on reliability (Online)"}],"ind1":"0","ind2":" "}},{"222":{"subfields":[{"a":"IEEE transactions on reliability"}],"ind1":"1","ind2":"0"}},{"245":{"subfields":[{"a":"IEEE transactions on reliability"},{"h":"[electronic resource] /"},{"c":"Professional Technical Group on Reliability."}],"ind1":"0","ind2":"0"}},{"246":{"subfields":[{"a":"Institute of Electrical and Electronics Engineers transactions on reliability"}],"ind1":"3","ind2":" "}},{"246":{"subfields":[{"a":"Transactions on reliability"}],"ind1":"3","ind2":"0"}},{"246":{"subfields":[{"a":"Reliability"}],"ind1":"3","ind2":"0"}},{"246":{"subfields":[{"a":"Reliability, IEEE Transactions on"}],"ind1":"2","ind2":" "}},{"260":{"subfields":[{"a":"[New York, N.Y.] :"},{"b":"[Institute of Electrical and Electronics Engineers],"},{"c":"[©1963]-"}],"ind1":" ","ind2":" "}},{"310":{"subfields":[{"a":"Quarterly,"},{"b":"<1999->"}],"ind1":" ","ind2":" "}},{"362":{"subfields":[{"a":"Vol. R-12, no. 1 (Mar. 1963)-"}],"ind1":"0","ind2":" "}},{"500":{"subfields":[{"a":"Title from cover."}],"ind1":" ","ind2":" "}},{"550":{"subfields":[{"a":"Volumes for 1963- issued by the Institute of Electrical and Electronics Engineers, Professional Technical Group on Reliability: <Oct. 1975>- by the IEEE Reliability Group; <1979-> by the IEEE Reliabil"}],"ind1":" ","ind2":" "}},{"550":{"subfields":[{"a":"Volume for <1975-> published also as the journal of the Electronics Division, American Society for Quality Co"}],"ind1":" ","ind2":" "}},{"650":{"subfields":[{"a":"Electronic industries"},{"x":"Quality control"},{"v":"Periodicals."}],"ind1":" ","ind2":"0"}},{"650":{"subfields":[{"a":"Industries e\u0301lectroniques"},{"x":"Qualite\u0301"},{"x":"Contro\u0302le"},{"v":"Pe\u0301riodiques."}],"ind1":" ","ind2":"6"}},{"650":{"subfields":[{"a":"Electronic industries"},{"x":"Quality control."},{"2":"fast"},{"0":"(OCoLC)fst00907274"}],"ind1":" ","ind2":"7"}},{"650":{"subfields":[{"a":"Elektrotechniek."},{"2":"gtt"}],"ind1":"1","ind2":"7"}},{"650":{"subfields":[{"a":"Betrouwbaarheid."},{"2":"gtt"}],"ind1":"1","ind2":"7"}},{"655":{"subfields":[{"a":"Periodicals."},{"2":"fast"},{"0":"(OCoLC)fst01411641"}],"ind1":" ","ind2":"7"}},{"655":{"subfields":[{"a":"Periodicals."},{"2":"lcgft"}],"ind1":" ","ind2":"7"}},{"710":{"subfields":[{"a":"Institute of Electrical and Electronics Engineers."},{"b":"Professional Technical Group on Reliability."}],"ind1":"2","ind2":" "}},{"710":{"subfields":[{"a":"IEEE Reliability Group."}],"ind1":"2","ind2":" "}},{"710":{"subfields":[{"a":"IEEE Reliability Society."}],"ind1":"2","ind2":" "}},{"710":{"subfields":[{"a":"American Society for Quality Control."},{"b":"Electronics Division."}],"ind1":"2","ind2":" "}},{"773":{"subfields":[{"t":"Engineering Source "},{"d":"EBSCO"}],"ind1":"0","ind2":" "}},{"776":{"subfields":[{"t":"IEEE transactions on reliability (Online)"},{"x":"1558-1721"},{"w":"(DLC) 2005214278"},{"w":"(OCoLC)44607842"}],"ind1":"1","ind2":" "}},{"776":{"subfields":[{"i":"Online version:"},{"t":"IEEE transactions on reliability"},{"w":"(OCoLC)562213690"}],"ind1":"0","ind2":"8"}},{"776":{"subfields":[{"t":"IEEE transactions on reliability /"},{"x":"0018-9529"},{"w":"(OCoLC)1752560"},{"w":"(DLC)57048223"}],"ind1":"1","ind2":" "}},{"780":{"subfields":[{"t":"IRE transactions on reliability and quality control"},{"x":"0097-4552"},{"w":"(DLC)sf 84001157"},{"w":"(OCoLC)2015055"}],"ind1":"0","ind2":"0"}},{"856":{"subfields":[{"3":"Abstracts available: Jun 1996-Dec 2022."},{"u":"https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=egs&jid=IOT&scope=site"},{"z":"Enlace del recurso"}],"ind1":"4","ind2":"0"}},{"901":{"subfields":[{"a":"Academic Journal"}],"ind1":" ","ind2":" "}}]}
|
| genre | Periodicals. fast (OCoLC)fst01411641 Periodicals. lcgft |
| genre_facet | Periodicals. Périodiques. |
| id | ebs737984e |
| illustrated | Illustrated |
| institution | EBSCO |
| issn | 1558-1721 0018-9529 0097-4552 |
| language | English |
| marc_error | Info : MARC8 translation shorter than ISO-8859-1, choosing MARC8. --- [ 901 : a ] |
| publishDate | 1963 |
| publisher | [Institute of Electrical and Electronics Engineers], |
| record_format | marc |
| spelling | IEEE transactions on reliability (Online) IEEE transactions on reliability IEEE transactions on reliability [electronic resource] / Professional Technical Group on Reliability. Institute of Electrical and Electronics Engineers transactions on reliability Transactions on reliability Reliability Reliability, IEEE Transactions on [New York, N.Y.] : [Institute of Electrical and Electronics Engineers], [©1963]- Quarterly, <1999-> Vol. R-12, no. 1 (Mar. 1963)- Title from cover. Volumes for 1963- issued by the Institute of Electrical and Electronics Engineers, Professional Technical Group on Reliability: <Oct. 1975>- by the IEEE Reliability Group; <1979-> by the IEEE Reliabil Volume for <1975-> published also as the journal of the Electronics Division, American Society for Quality Co Electronic industries Quality control Periodicals. Industries électroniques Qualité Contrôle Périodiques. Electronic industries Quality control. fast (OCoLC)fst00907274 Elektrotechniek. gtt Betrouwbaarheid. gtt Periodicals. fast (OCoLC)fst01411641 Periodicals. lcgft Institute of Electrical and Electronics Engineers. Professional Technical Group on Reliability. IEEE Reliability Group. IEEE Reliability Society. American Society for Quality Control. Electronics Division. Engineering Source EBSCO IEEE transactions on reliability (Online) 1558-1721 (DLC) 2005214278 (OCoLC)44607842 Online version: IEEE transactions on reliability (OCoLC)562213690 IEEE transactions on reliability / 0018-9529 (OCoLC)1752560 (DLC)57048223 IRE transactions on reliability and quality control 0097-4552 (DLC)sf 84001157 (OCoLC)2015055 Abstracts available: Jun 1996-Dec 2022. https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=egs&jid=IOT&scope=site Enlace del recurso |
| spellingShingle | IEEE transactions on reliability Electronic industries Quality control Periodicals. Industries électroniques Qualité Contrôle Périodiques. Electronic industries Quality control. fast (OCoLC)fst00907274 Elektrotechniek. gtt Betrouwbaarheid. gtt |
| thumbnail | /EBSCO/ebsco_engineeringsource/logo.png |
| title | IEEE transactions on reliability |
| title_alt | IEEE transactions on reliability (Online) Institute of Electrical and Electronics Engineers transactions on reliability Transactions on reliability Reliability Reliability, IEEE Transactions on |
| title_auth | IEEE transactions on reliability |
| title_full | IEEE transactions on reliability [electronic resource] / Professional Technical Group on Reliability. |
| title_fullStr | IEEE transactions on reliability [electronic resource] / Professional Technical Group on Reliability. |
| title_full_unstemmed | IEEE transactions on reliability [electronic resource] / Professional Technical Group on Reliability. |
| title_old | IRE transactions on reliability and quality control |
| title_short | IEEE transactions on reliability |
| title_sort | ieee transactions on reliability |
| topic | Electronic industries Quality control Periodicals. Industries électroniques Qualité Contrôle Périodiques. Electronic industries Quality control. fast (OCoLC)fst00907274 Elektrotechniek. gtt Betrouwbaarheid. gtt |
| topic_facet | Electronic industries Industries électroniques Elektrotechniek. Betrouwbaarheid. Quality control Qualité Contrôle Quality control. |
| url | https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=egs&jid=IOT&scope=site |
| work_keys_str_mv | UT ieeetransactionsonreliabilityonline AT instituteofelectricalandelectronicsengineersprofessionaltechnicalgrouponreliability ieeetransactionsonreliability AT ieeereliabilitygroup ieeetransactionsonreliability AT ieeereliabilitysociety ieeetransactionsonreliability AT americansocietyforqualitycontrolelectronicsdivision ieeetransactionsonreliability AT instituteofelectricalandelectronicsengineersprofessionaltechnicalgrouponreliability instituteofelectricalandelectronicsengineerstransactionsonreliability AT ieeereliabilitygroup instituteofelectricalandelectronicsengineerstransactionsonreliability AT ieeereliabilitysociety instituteofelectricalandelectronicsengineerstransactionsonreliability AT americansocietyforqualitycontrolelectronicsdivision instituteofelectricalandelectronicsengineerstransactionsonreliability AT instituteofelectricalandelectronicsengineersprofessionaltechnicalgrouponreliability transactionsonreliability AT ieeereliabilitygroup transactionsonreliability AT ieeereliabilitysociety transactionsonreliability AT americansocietyforqualitycontrolelectronicsdivision transactionsonreliability AT instituteofelectricalandelectronicsengineersprofessionaltechnicalgrouponreliability reliability AT ieeereliabilitygroup reliability AT ieeereliabilitysociety reliability AT americansocietyforqualitycontrolelectronicsdivision reliability AT instituteofelectricalandelectronicsengineersprofessionaltechnicalgrouponreliability reliabilityieeetransactionson AT ieeereliabilitygroup reliabilityieeetransactionson AT ieeereliabilitysociety reliabilityieeetransactionson AT americansocietyforqualitycontrolelectronicsdivision reliabilityieeetransactionson |
