Electronic device failure analysis

Electronic device failure analysis

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Bibliographic Details
Previous Title:Electronic device failure analysis news
Corporate Authors: ASM International, Electronic Device Failure Analysis Society
Format: Electronic Journal
Language:English
Published: Materials Park, OH : ASM International
Subjects:
Electronic apparatus and appliances > Reliability > Periodicals.
Electronic apparatus and appliances > Testing > Periodicals.
System failures (Engineering) > Periodicals.
Electronic apparatus and appliances > Reliability.
Electronic apparatus and appliances > Testing.
System failures (Engineering)
Electronic journals.
Periodicals.
Online Access:Enlace del recurso
Description
Published:Began in 2001.
Publication Frequency:Quarterly
ISSN:1537-0755
1521-9259

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