Test & measurement world
Saved in:
| Previous Title: | Electronics test |
|---|---|
| Format: | Electronic Journal |
| Language: | English |
| Published: |
[Boston, MA] :
[Interfield Pub. Co.],
[Ã1981]-
|
| Subjects: | |
| Online Access: | Enlace del recurso |
| _version_ | 1849706550635003904 |
|---|---|
| building | Library A |
| callnumber-first | T - Technology |
| callnumber-label | TK7869 |
| callnumber-raw | TK7869 .T47 |
| callnumber-search | TK7869 .T47 |
| callnumber-sort | TK 47869 T47 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | Ebsco Engineering Source |
| ctrlnum | (EBZ)ebs495484e |
| dateSpan | [Vol. 1, no. 1] (fall 1981)- |
| format | Electronic Journal |
| fullrecord | {"leader":"01628cas a22003972a 4500","fields":[{"001":"ebs495484e"},{"003":"EBZ"},{"006":"m d ||||||"},{"007":"cr|unu||||||||"},{"008":"820120c19819999maumn p o 0 a0eng c"},{"022":{"subfields":[{"y":"0744-1657"}],"ind1":" ","ind2":" "}},{"035":{"subfields":[{"a":"(EBZ)ebs495484e"}],"ind1":" ","ind2":" "}},{"040":{"subfields":[{"a":"NSD "},{"b":"eng "},{"d":"EBZ"}],"ind1":" ","ind2":" "}},{"042":{"subfields":[{"a":"pcc nsdp"}],"ind1":" ","ind2":" "}},{"050":{"subfields":[{"a":"TK7869"},{"b":".T47"}],"ind1":"0","ind2":"0"}},{"130":{"subfields":[{"a":"Test & measurement world (Online)"}],"ind1":"0","ind2":" "}},{"222":{"subfields":[{"a":"Test & measurement world"}],"ind1":"1","ind2":"0"}},{"245":{"subfields":[{"a":"Test & measurement world"},{"h":"[electronic resource]."}],"ind1":"0","ind2":"0"}},{"246":{"subfields":[{"a":"Test and measurement world"}],"ind1":"3","ind2":"0"}},{"260":{"subfields":[{"a":"[Boston, MA] :"},{"b":"[Interfield Pub. Co.],"},{"c":"[Ã1981]-"}],"ind1":" ","ind2":" "}},{"310":{"subfields":[{"a":"Monthly (except twice in Feb.),"},{"b":"<Feb. 15, 1990->"}],"ind1":" ","ind2":" "}},{"362":{"subfields":[{"a":"[Vol. 1, no. 1] (fall 1981)-"}],"ind1":"0","ind2":" "}},{"500":{"subfields":[{"a":"Published: Cahners Pub. Co., <Feb. 15, 1990->"}],"ind1":" ","ind2":" "}},{"500":{"subfields":[{"a":"Title from cover."}],"ind1":" ","ind2":" "}},{"650":{"subfields":[{"a":"Electronic apparatus and appliances"},{"x":"Testing"},{"v":"Periodicals."}],"ind1":" ","ind2":"0"}},{"650":{"subfields":[{"a":"Automatic test equipment"},{"v":"Periodicals."}],"ind1":" ","ind2":"0"}},{"650":{"subfields":[{"a":"Automatic test equipment."},{"2":"fast"},{"0":"(OCoLC)fst01432130"}],"ind1":" ","ind2":"7"}},{"650":{"subfields":[{"a":"Electronic apparatus and appliances"},{"x":"Testing."},{"2":"fast"},{"0":"(OCoLC)fst00906837"}],"ind1":" ","ind2":"7"}},{"655":{"subfields":[{"a":"Electronic journals."}],"ind1":" ","ind2":"0"}},{"655":{"subfields":[{"a":"Periodicals."},{"2":"fast"},{"0":"(OCoLC)fst01411641"}],"ind1":" ","ind2":"7"}},{"655":{"subfields":[{"a":"Periodicals."},{"2":"lcgft"}],"ind1":" ","ind2":"7"}},{"773":{"subfields":[{"t":"Engineering Source "},{"d":"EBSCO"}],"ind1":"0","ind2":" "}},{"776":{"subfields":[{"t":"Test & measurement world"},{"x":"0744-1657"},{"w":"(OCoLC)8077236"},{"w":"(DLC)82641780"}],"ind1":"1","ind2":" "}},{"780":{"subfields":[{"t":"Electronics test"},{"x":"0164-9620"},{"w":"(DLC) 79640173"},{"w":"(OCoLC)4255697"}],"ind1":"0","ind2":"5"}},{"856":{"subfields":[{"3":"Abstracts available: Jul 1997-Mar 2012."},{"u":"https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=egs&jid=16T&scope=site"},{"z":"Enlace del recurso"}],"ind1":"4","ind2":"0"}},{"901":{"subfields":[{"a":"Trade Publication"}],"ind1":" ","ind2":" "}}]}
|
| genre | Electronic journals. Periodicals. fast (OCoLC)fst01411641 Periodicals. lcgft |
| genre_facet | Periodicals. Electronic journals. |
| id | ebs495484e |
| illustrated | Illustrated |
| institution | EBSCO |
| issn | 0744-1657 0164-9620 |
| language | English |
| marc_error | Info : Unimarc and ISO-8859-1 translations identical, choosing ISO-8859-1. --- [ 901 : a ] |
| publishDate | 1981 |
| publisher | [Interfield Pub. Co.], |
| record_format | marc |
| spelling | Test & measurement world (Online) Test & measurement world Test & measurement world [electronic resource]. Test and measurement world [Boston, MA] : [Interfield Pub. Co.], [Ã1981]- Monthly (except twice in Feb.), <Feb. 15, 1990-> [Vol. 1, no. 1] (fall 1981)- Published: Cahners Pub. Co., <Feb. 15, 1990-> Title from cover. Electronic apparatus and appliances Testing Periodicals. Automatic test equipment Periodicals. Automatic test equipment. fast (OCoLC)fst01432130 Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Electronic journals. Periodicals. fast (OCoLC)fst01411641 Periodicals. lcgft Engineering Source EBSCO Test & measurement world 0744-1657 (OCoLC)8077236 (DLC)82641780 Electronics test 0164-9620 (DLC) 79640173 (OCoLC)4255697 Abstracts available: Jul 1997-Mar 2012. https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=egs&jid=16T&scope=site Enlace del recurso |
| spellingShingle | Test & measurement world Electronic apparatus and appliances Testing Periodicals. Automatic test equipment Periodicals. Automatic test equipment. fast (OCoLC)fst01432130 Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 |
| thumbnail | /EBSCO/ebsco_engineeringsource/logo.png |
| title | Test & measurement world |
| title_alt | Test & measurement world (Online) Test and measurement world |
| title_auth | Test & measurement world |
| title_full | Test & measurement world [electronic resource]. |
| title_fullStr | Test & measurement world [electronic resource]. |
| title_full_unstemmed | Test & measurement world [electronic resource]. |
| title_old | Electronics test |
| title_short | Test & measurement world |
| title_sort | test measurement world |
| topic | Electronic apparatus and appliances Testing Periodicals. Automatic test equipment Periodicals. Automatic test equipment. fast (OCoLC)fst01432130 Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 |
| topic_facet | Electronic apparatus and appliances Automatic test equipment Automatic test equipment. Testing Testing. |
| url | https://uwiener.metaproxy.org/UWIENER?url=https://search.ebscohost.com/direct.asp?db=egs&jid=16T&scope=site |
| work_keys_str_mv | UT testmeasurementworldonline |